DI-Multimode Atomic Force Microscopy

A multimode AFM manufactured by DI-Instrument is the highest resolution, commercially available scanning probe microscope (SPM). It is a useful instrument for atomic-scale resolution imaging of the material surfaces.

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Fast-scanning tunneling microscope (velociter-STM)

Nowadays, Scanning Tunneling Microscopy, “STM”, is used widely, and is considered as one of the most powerful and effective instruments to investigate the structure of materials at the nanoscale. The Fast- STM is a commercial instrument STM 150 Aarhus from Specs Surface Nano Analysis company.

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High-resolution electron energy loss spectroscopy (HREELS)

High-resolution electron energy loss spectroscopy (HREELS) is one of the most advanced analytic methods in surface science. This method covers not only basically all relevant vibrational frequencies, but it is also sensitive to electronic excitations (plasmons, HOMO–LUMO excitations) and can thus provide a bulk of valuable information about vibrational, geometric and electronic properties of adsorbates on solid substrates (usually well-defined metal or metal oxide single-crystal surfaces).

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Femtosecond Laser Scanning Tunneling Microscope (fs-STM)

The fs-STM is a combination of a low-temperature STM with a femtosecond laser system. The STM system is operated in UHV and consists of four chambers. The STM chamber is connected to a preparation chamber, in which the samples are cleaned by ion sputtering and annealing. A molecule deposition chamber is attached to the preparation chamber and is used to prepare and deposit sample molecules on the single-crystaline samples.

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Multi-scale Scanning Tunneling Microscope (Multi-STM)

Here, we present the advanced Scanning Tunneling Microscope (STM), so called Multi-scale STM. Why this STM is different than other STMs? So called Multi-STM consists of two different stages, a beetle-type and a flexure-stage XYZ-scanning stage. Both stages are combined to form two stages STM that operates at room temperature in ultra-high vacuum conditions and is capable of scanning areas of up to 450 µm × 450 µm down to resolutions on the nanometer scale.

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Scanning tunneling/scanning electron microscope Jeol JSPM-4500S – „Schmetterling“

The JSPM-4500S from Jeol offers the possibility to prepare and investigate the sample surface by multiple surface probe techniques under ultra-high vacuum (UHV) and consists of three different chambers separated by gate valves.
The measurement chamber is equipped with a scanning tunneling microscope (STM), a scanning electron microscope (SEM), an x-ray source an a hemispherical analyzer for x-ray photoelectron spectroscopy (XPS). The combination of the SEM and the electron energy analyzer can also be used for scanning Auger microscopy (SAM). The sample temperature can be varied from 50 K to 870 K using a cryostat and indirect sample heating.

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The Low-Temperature-Scanning-Tunneling/Atomic-Force-Microscope (LT-STM/AFM)

Since their invention, AFM and STM became widely used tools and essential in surface science thanks to the ability to observe, manipulate, and characterize nanostructures and even single molecules or atoms prepared in an highly controllable environment within an ultra-high vacuum chamber.

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Photoemission Spectroscopy (X-ray = XPS, Ultraviolet = UPS), Auger Electron Spectroscopy (AES) and Low Energy Electron Spectroscopy (LEED) - Parasol

The Parasol offers the possibility to prepare and investigate the sample surface by multiple surface probe techniques. The system is equipped with a hemisphere analyzer (SPECS, PHOIBOS 100), the overall energy resolution is lower than 0.3 eV. The analyzer is capable of analyzing the (kinetic) energies of the sample emitted electrons, which are excited by X-rays, Ultraviolet (UV), and electron beam.

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Ultrahigh Vacuu m Fourier Transform Infrared Spectroscopy (UHV-FTIRS)

We have designed a new ultrahigh vacuum (UHV) apparatus which combines a state-of-the-art vacuum IR spectrometer (Bruker, VERTEX 80v) with a novel UHV system (Prevac) consisting of load-lock, distribution, measurement and high-pressure chambers.

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