This research project is aimed to
modify locally on a micron scale the
elastic and thermal properties of the
NiTi shape memory alloys (SMA) using
focused ion beams (FIB). The high-resolution
local patterning is perfomed and tested
on semi-finished SMA, NiTi films, NiTi-wires
and micro actors. The use of an infrared-CCD
microscope camera and the simultaneous
imaging of the secondary electrons
emitted in the course of the impact of
the scanned ion beam allow a
visualization of the modified area and
the adjustment of the sample. The induced
microstructure is controlled by
transmission electron microscopy,
infrared thermography and photothermal
microscopy. Photothermal techniques and
scanning thermal microscopy are applied
to study the depth dependence of the near
surface modifications of the thermo-physical
properties. The creation and relaxation
of disclocations as a consequence of the
thermal and mechanical treatment of the
SMA is investigated by frequency
dependent ultrasound attenuation.
