Atomic Force Microscope-AFM
The group uses the atomic force microscope (AFM) as a routine tool for the characterization of surface topographies. Actually, it is used to characterize porous nanometric sensor structures in the framework of the NanoBioPore project. The resolution reached in contact-mode is in the lower sub-micrometer range but principally, atomic resolution is possible. The Topometrix Explorer also bears a non-contact option for measurements of smooth surfaces like polymer coated materials.