X-ray diffraction

X-ray diffraction

The PANalytical X’Pert PRO X-ray diffraction system is used for the high-throughput characterization of material libraries. Phase analysis of thin films and bulk samples can be performed, as well as reflectometry of thin layers and analysis of residual stresses. The system is equipped with a PiXcel detector that permits the acquisition of diffraction patterns in short times. Also, the phase analysis of batches of samples is possible. The analysis of small spots can be performed via using a microcapillary with a Diameter of 800 µm.

The system is equipped with a heating/cooling stage that enables the analysis of changes in the crystalline structure as a function of temperature in the range of -100 °C to 900 °C.